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Scanning stressy probes - concept and use in atomic force microscopy
- Scanning Probe Microscopy, Sensors and Nanostructures Conference 2002
citation
Hantschel, T. ; Chow, E. M. ; Fork, D. K. Scanning stressy probes - concept and use in atomic force microscopy. Scanning Probe Microscopy, Sensors and Nanostructures Conference 2002; 2002 May 26-29; Las Vegas; NV; USA.
PARC author
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