homeresources & publications › scanning stressy probes - concept and use in atomic force microscopy

TECHNICAL PUBLICATIONS:

Scanning stressy probes - concept and use in atomic force microscopy

 
 
citation

Hantschel, T. ; Chow, E. M. ; Fork, D. K. Scanning stressy probes - concept and use in atomic force microscopy. Scanning Probe Microscopy, Sensors and Nanostructures Conference 2002; 2002 May 26-29; Las Vegas; NV; USA.