home › resources & publications › self-stabilization in amorphous silicon circuits
TECHNICAL PUBLICATIONS:
Self-stabilization in amorphous silicon circuits
Thin film transistors (TFTs) based on disordered semiconductors such as amorphous hydrogenated silicon(a-Si:H) experience a threshold voltage shift (VT shift) with time in the presence of a gate bias. The VT shift needs to be compensated for in TFT circuits. We study an interesting property of self compensation in fundamental analog TFT circuits with one a part of the circuit compensating for the effects of VT shift in the other and vice-versa.
citation
Sambandan, S. ; Street, R. A. Self-stabilization in amorphous silicon circuits. IEEE Electron Device Letters. 2009 January; 30 (1): 45-47.
PARC author
related focus areas
related publications
Hybrid Si nanowire/amorphous silicon FETs for large-area image sensor arrays
Fast polymer semiconductor transistor by nano-particle self-assembly
Jet-printed and dielectrophoretically aligned nanowires for large area electronics
Jet-printed Si nanowires for flexible backplane applications
Compact model for forward subthreshold characteristics in polymer semiconductor transistors
