Deep level transient spectroscopy: a case study on GaAs

• Characterization of Compound Semiconductor Processing

citation

Götz, W. K.; Johnson, N. M. Deep level transient spectroscopy: a case study on GaAs. In Characterization of Compound Semiconductor Processing edited by Y. Strausser and G. E. McGuire. Boston: Butterworth-Heinemann; 1995; 109-123.