Accurate measurements of capture cross-sections of semiconductor insulator interface states by a trap-filling experiment: the charge-potential feedback effect

• Journal of Applied Physics

citation

D. Goguenheim, D. Vuillaume, G. Vincent, and N. M. Johnson, "Accurate measurements of capture cross-sections of semiconductor insulator interface states by a trap-filling experiment: the charge-potential feedback effect," Journal of Applied Physics, Vol. 68, No. 3, pp. 1104-1113 (1 August 1990).