homeresources & publications › electrical and optical characterization of metastable deep-level defects in gaas

TECHNICAL PUBLICATIONS:

Electrical and optical characterization of metastable deep-level defects in GaAs

 
 
citation

W. R. Buchwald, G. J. Gerardi, E. H. Poindexter, N. M. Johnson, H. G. Grimmeiss, and D. J. Keeble, "Electrical and optical characterization of metastable deep-level defects in GaAs,” Physical Review B, Vol. 40, No. 5, pp. 2940-2945 (August 15, 1989).