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Trapping time in processed polycrystalline silicon measured by picosecond time-resolved reflectivity

 
 
citation

N. K. Bambha, W. L. Nighan, Jr., I. H. Campbell, P. M. Fauchet, and N. M. Johnson, "Trapping time in processed polycrystalline silicon measured by picosecond time-resolved reflectivity,” Journal of Applied Physics, Vol. 63, No. 7, pp. 2316-2321 (1988).