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Trapping time in processed polycrystalline silicon measured by picosecond time-resolved reflectivity

  • Journal of Applied Physics
 
 
citation

N. K. Bambha, W. L. Nighan, Jr., I. H. Campbell, P. M. Fauchet, and N. M. Johnson, "Trapping time in processed polycrystalline silicon measured by picosecond time-resolved reflectivity,” Journal of Applied Physics, Vol. 63, No. 7, pp. 2316-2321 (1988).

PARC author

Noble Johnson

 

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