Electronic and optical properties of silicon dangling-bond defects at the Si-SiO2 interface

• The Physics and Chemistry of SiO2 and the Si-SiO2 Interface

citation

N. M. Johnson, "Electronic and optical properties of silicon dangling-bond defects at the Si-SiO2 interface,” The Physics and Chemistry of SiO2 and the Si-SiO2 Interface (Plenum, New York, 1988), eds. C. R. Helms and B. E. Deal, pp. 319-326.