homeresources & publications › microscopic identity of characteristic gap states at the interface in oxide-on-si structures

TECHNICAL PUBLICATIONS:

Microscopic identity of characteristic gap states at the interface in oxide-on-Si structures

 
 
citation

N. M. Johnson and E. H. Poindexter, "Microscopic identity of characteristic gap states at the interface in oxide-on-Si structures," Properties of Silicon (INSPEC, New York, 1988), EMIS Datareviews Series, No. 4 (RN=16169), pp. 548-553.