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EBIC measurement and grain-boundary recombination in SOI polycrystalline silicon

 
 
citation

K.-C. Wu, R. W. Dutton, and N. M. Johnson, "EBIC measurement and grain-boundary recombination in SOI polycrystalline silicon," IEEE Transactions on Electron Devices, Vol. ED-33, No. 7, pp. 1020-1027 (July 1986).