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Native defects at the Si/SiO2 interface-amorphous silicon revisited

 
 
citation

D. K. Biegelsen, N. M. Johnson, M. Stutzmann, E. H. Poindexter, and P. J. Caplan, "Native defects at the Si/SiO2 interface-amorphous silicon revisited," Applications of Surface Science, Vol. 22/23, pp. 879-890 (1985).