Deep-level transient spectroscopy: from characterization to electronic defect identification

• Proceedings of the SPIE Conference on Spectroscopic Characterization Techniques for Semiconductor Technology II

citation

N. M. Johnson, "Deep-level transient spectroscopy: from characterization to electronic defect identification," Proceedings of the SPIE Conference on Spectroscopic Characterization Techniques for Semiconductor Technology II (SPIE, Bellingham, 1985), ed. F. H. Pollak, pp. 34-44.