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Deep-level transient spectroscopy: from characterization to electronic defect identification

 
 
citation

N. M. Johnson, "Deep-level transient spectroscopy: from characterization to electronic defect identification," Proceedings of the SPIE Conference on Spectroscopic Characterization Techniques for Semiconductor Technology II (SPIE, Bellingham, 1985), ed. F. H. Pollak, pp. 34-44.