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Measurement of gap states in a-Si:H by photocapacitance spectroscopy

 
 
citation

N. M. Johnson and D. K. Biegelsen, "Measurement of gap states in a-Si:H by photocapacitance spectroscopy," Proceedings of the 17th International Conference on the Physics of Semiconductors (Springer-Verlag, New York, 1985), eds. D. J. Chadi and W. A. Harrison, pp. 817-820.