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TECHNICAL PUBLICATIONS:
Optical absorption by electronic defects at the Si-SiO2 interface
- Journal of Electronic Materials
citation
N. M. Johnson, W. B. Jackson, and M. D. Moyer, "Optical absorption by electronic defects at the Si-SiO2 interface," Journal of Electronic Materials, Vol. 14a, pp. 499-503 (1985).
PARC author
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