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Optical spectroscopy of the trivalent silicon defect at the Si-SiO2 interface

  • Physical Review B
 
 
citation

N. M. Johnson, W. B. Jackson, and M. D. Moyer, Optical spectroscopy of the trivalent silicon defect at the Si-SiO2 interface, Physical Review B, Vol. 31, pp. 1194-1197 (1985).

PARC author

Noble Johnson

 

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