Defect states in GaAs after rapid thermal annealing
R. A. Street, N. M. Johnson, and R. D. Burnham, "Defect states in GaAs after rapid thermal annealing," Microscopic Identification of Electronic Defects in Semiconductors (Materials Research Society, Pittsburgh, PA, 1985), eds. N. M. Johnson, S. G. Bishop, and G. D. Watkins, MRS Proceedings Vol. 46, pp. 333-338.