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Defect states in GaAs after rapid thermal annealing

 
 
citation

R. A. Street, N. M. Johnson, and R. D. Burnham, "Defect states in GaAs after rapid thermal annealing," Microscopic Identification of Electronic Defects in Semiconductors (Materials Research Society, Pittsburgh, PA, 1985), eds. N. M. Johnson, S. G. Bishop, and G. D. Watkins, MRS Proceedings Vol. 46, pp. 333-338.