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Detection of electronic defects in strip-heater crystallized silicon thin films

 
 
citation

N. M. Johnson, M. D. Moyer, L. E. Fennell, E. W. Maby, and H. Atwater, "Detection of electronic defects in strip-heater crystallized silicon thin films," Proceedings of the Materials Research Society Symposium on Laser-Solid Interactions and Transient Thermal Processing of Materials (Elsevier, New York, 1983), eds. J. Narayan, W. L. Brown, and R. A. Lemons, pp. 491-497.