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Correlated electrical and microstructural studies of recrystallized silicon thin films on bulk glass substrates

 
 
citation

D. K. Biegelsen, N. M. Johnson, R. J. Nemanich, M. D. Moyer and L. E. Fennell, "Correlated electrical and microstructural studies of recrystallized silicon thin films on bulk glass substrates," Laser and Electron-Beam Interactions with Solids (Elsevier, New York, 1982), eds. B. R. Appleton and G. K. Celler, pp. 331-336.