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Measurement and analysis of current transients in well-characterized a-Si:H

  • Journal de Physique
 
 
citation

M. J. Thompson, N. M. Johnson, and R. A. Street, "Measurement and analysis of current transients in well-characterized a-Si:H," Journal de Physique, Vol. 42-C4, pp. 617-620 (1981).

PARC authors

Noble Johnson
Bob Street

 

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