Constant-capacitance DLTS measurement of defect-density profiles in semiconductors

• Journal of Applied Physics

citation

N. M. Johnson, D. J. Bartelink, R. B. Gold, and J. F. Gibbons, "Constant-capacitance DLTS measurement of defect-density profiles in semiconductors," Journal of Applied Physics, Vol. 50, pp. 4828-4833 (1979).