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Raman studies of structural defects in vitreous SiO2 and GeO2

 
 
citation

F. L. Galeener, J. Mikkelsen, and N. M. Johnson, "Raman studies of structural defects in vitreous SiO2 and GeO2," The Physics of SiO2 and Its Interfaces (Pergamon Press, New York, 1978), ed. S. T. Pantelides, pp. 284-288.