Electronic properties of a characteristic discrete level at the Si-SiO2 interface

• IEEE Transactions on Electron Devices

citation

N. M. Johnson, D. J. Bartelink, and J. P. McVittie, "Electronic properties of a characteristic discrete level at the Si-SiO2 interface," IEEE Transactions on Electron Devices, Vol. ED-25, p. 1348 (extended abstract) (1978).