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Transient capacitance measurements of electronic states at the SiO2-Si interface

 
 
citation

N. M. Johnson, D. J. Bartelink, and M. Schulz, "Transient capacitance measurements of electronic states at the SiO2-Si interface," The Physics of SiO2 and Its Interfaces (Pergamon Press, New York, 1978), ed. S. T. Pantelides, pp. 421-427.