Origin of the anomalous pulse-width dependence in capacitance transient measurements on n-type a-Si:H

• Journal of Non-Crystalline Solids

citation

Jackson, W. B. , Johnson, N. M. Origin of the anomalous pulse-width dependence in capacitance transient measurements on n-type a-Si:H. Proceedings of the 16th International Conference on Amorphous Semiconductors - Science and Technology; 1995 September 4-8; Kobe, Japan. In Journal of Non-Crystalline Solids; 1996 May 2; 198-200 (2): 517-520.