home › resources & publications › the effect of growth parameters on the quality of gan thick films grown by hydride vapor phase epitaxy
TECHNICAL PUBLICATIONS:
The effect of growth parameters on the quality of GaN thick films grown by hydride vapor phase epitaxy
- Materials Research Society Spring Meeting
citation
Molnar, R. J. ; Brown, E. R. ; Goetz, W .; Romano, L. T. ; Johnson, N. M. The effect of growth parameters on the quality of GaN thick films grown by hydride vapor phase epitaxy. Spring 1996 Meeting of the Materials Research Society; 1996 April 8; San Francisco, CA.
PARC author
related publications
Structural characterization of high quality GaN films grown by hydride vapor phase epitaxy
Characterization of AlGaInN heterostructures and laser diodes
Material characterizations for III-Nitride based light emitters
Thickness dependence of electronic properties of GaN epi-layers
Characterization of OMVPE-grown AlGalnN heterostructures
Characterization of AlGaInN heterostructures grown by OMVPE
