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Effect of non-ohmic back contacts in capacitance transient measurements on hydrogenated amorphous silicon

  • Physical Review B [Condensed Matter]
 
 
citation

Jackson, W. B. ; Johnson, N. M. Effect of non-ohmic back contacts in capacitance transient measurements on hydrogenated amorphous silicon. Physical Review B [Condensed Matter]. 1995 July 15; 52(4): 2233-2236.

PARC author

Noble Johnson

 

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