Defects in single-crystal silicon induced by hydrogenation

Physical Review B

1987

Deep level transient spectroscopy: defect characterization in semiconductor devices

Materials Characterization, MRS Proceedings Vol. 69

1987

Tunable electroabsorption and electro-luminescence in GaAs doping superlattices

Superlattices and Micro-structures

1987

The localization and crystallographic dependence of Si suboxide species at the SiO2/Si interface

Journal of Applied Physics

1987

Tunable electroabsorption and electroluminescence in GaAs doping superlattices

Proceedings of the SPIE Conference on Quantum Well and Superlattice Physics

1987

Tunable electroabsorption and electroluminescence in GaAs doping superlattices

Applied Physics Letters

1987

New metastable defects in GaAs

Applied Physics Letters

1987

Beyond the chalkboard: computer support for collaboration and problem solving in meetings

Communications of the ACM

January 1987

Straightening out softening up: response to Carroll and Campbell

Human-Computer Interaction

31 December 1986

The model human processor: an engineering model for human performance

Handbook of Perception and Human Performance

31 December 1986

Understanding key constraints governing human-computer interfaces

Proceedings of the 1986 Workshop on Interactive 3D Graphics

23 October 1986

Expert systems: perils and promise

Communications of the ACM

September 1986

EBIC measurement and grain-boundary recombination in SOI polycrystalline silicon

IEEE Transactions on Electron Devices

July 1986

Rooms: the use of multiple virtual workspaces to reduce space contention in a window-based graphical user interface

ACM Transactions on Graphics

1 July 1986

The workstation, the Interpress page and document description language

Computer Magazine

June 1986

Impulse photoconductivity of thin-film polycrystalline silicon

Journal of Applied Physics

1 May 1986

Hydrogenation of the 'new oxygen donor' traps in silicon

Applied Physics Letters

7 April 1986

Perspectives on artificial intelligence programming

Science

28 February 1986

Selective hydrogen passivation of oxygen-related thermal-donor clusters in silicon

Materials Science Forum

1986

Interstitial hydrogen and neutralization of shallow-donor impurities in single-crystal silicon

Physical Review Letters

1986

Hydrogen passivation of the oxygen-related thermal-donor defect in silicon

Applied Physics Letters

1986

Hydrogen passivation of shallow-acceptor impurities in p-type GaAs

Physical Review B

1986

Electrical characterization of crystallized silicon thin films

Semiconductor-on-Insulator and Thin-film Transistor Technology, MRS Proceedings Vol. 53

1986

Deep level transient spectroscopy: characterization and identification of electronic defects

Journal of Optical Engineering

1986

DLTS studies on the 'new oxygen donor' in heat treated and hydrogenated Cz-grown silicon

Oxygen, Carbon, Hydrogen, and Nitrogen in Crystalline Silicon, MRS Proceedings Vol. 59

1986

Interface traps and Pb centers in oxidized (100) silicon wafers

Applied Physics Letters

1986

Thin-film transistor technology for large-area integrated circuits

IEEE ElectroTechnology Review

1986

Photoconduction in thin-film transistors fabricated from laser-crystallized silicon on fused quartz

Semiconductor-on-Insulator and Thin-film Transistor Technology, MRS Proceedings Vol. 53

1986

A taste of Smalltalk

Norton

1986

Integrating access-oriented programming into a multi-paradigm environment

IEEE Software

January 1986

Strategic computing at DARPA

Communications of the ACM

1 July 1985

Windows: why they were invented, how they help

The Office

1 March 1985

The electrical characterization of surfaces, interfaces, and contacts to a-Si:H

Philosophical Magazine B

1985

Dopant and defect states in a-Si:H

Philosophical Magazine

1985

Defect states in GaAs after rapid thermal annealing

Microscopic Identification of Electronic Defects in Semiconductors, MRS Proceedings Vol. 46

1985

Optical spectroscopy of the trivalent silicon defect at the Si-SiO2 interface

Physical Review B

1985

Optical absorption by electronic defects at the Si-SiO2 interface

Journal of Electronic Materials

1985

Microscopic identification of electronic defects in semiconductors

Materials Research Society Symposium Proceedings, vol. 46

1985

Mechanism for hydrogen compensation of shallow-acceptor impurities in single-crystal silicon

Physical Review B

1985

Measurement of gap states in a-Si:H by photocapacitance spectroscopy

Proceedings of the 17th International Conference on the Physics of Semiconductors

1985

Identification of deep-gap states in a-Si:H by photodepopulation-induced electron-spin resonance

Physical Review B

1985

Energy placement of the D- dangling-bond transition in a-Si:H from photocapacitance and photocurrent spectroscopies

Journal of Non-Crystalline Solids

1985

Electronic defects in transient, thermally processed semiconductors

Energy Beam-Solid Interactions and Transient Thermal Processing/1984, MRS Symposium Proceedings Vol. 35

1985

Electric-field dependence of hydrogen neutralization of shallow-acceptor impurities in single-crystal silicon

Applied Physics Letters

1985

Deep-level transient spectroscopy: from characterization to electronic defect identification

Proceedings of the SPIE Conference on Spectroscopic Characterization Techniques for Semiconductor Technology II

1985

Absence of oxygen diffusion during hydrogen passivation of shallow-acceptor impurities in single-crystal silicon

Applied Physics Letters

1985

Comparison of the optical cross section for the Si dangling bond in a-Si:H and at the c-Si/SiO2 interface

Microscopic Identification of Electronic Defects in Semiconductors, MRS Proceedings Vol. 46

1985

Microwave plasma oxidation of silicon

Journal of Electronic Materials

1985

High-gain photodetectors in thin-film transistors fabricated from laser-crystallized silicon on fused silica

IEEE Transactions on Electron Devices

1985

Charge trapping and impurity diffusion in nitrided oxides on silicon

Proceedings of the 1985 International Symposium on VLSI Technology, Systems and Applications

1985

Optically-heated zone crystal growth of silicon thin films on amorphous substrates

Silicon-on-Insulator: Its Technology and Applications

1985

Native defects at the Si/SiO2 interface-amorphous silicon revisited

Applications of Surface Science

1985

The prospects for psychological science in human-computer interaction

Human-Computer Interaction

1 January 1985

Visual search of computer command menus

Attention and Performance X, Control of Language Processes; International Symposium on Attention and Performance; 1982; Venlo, N

31 December 1984

On-line composition of text

INTERACT '84; First IFIP Conference on Human-Computer Interaction

4 September 1984

Window-based computer dialogues

INTERACT '84; First IFIP Conference on Human-Computer Interaction

4 September 1984

Photodepopulation-induced ESR measurement of deep gap states in a-Si:H

Proceedings of AIP Conference on Optical Effects in Amorphous Semiconductors

August 1984

Electronic traps and Pb centers at the Si/SiO2 interface: band-gap energy distribution

Journal of Applied Physics

1984

Electronic defects in silicon after transient isothermal annealing

Energy Beam-Solid Interactions and Transient Thermal Processing, MRS Symposium Proceedings, vol. 23

1984

Highly photosensitive transistors in single-crystal silicon thin films on fused silica

Applied Physics Letters

1984

Energy beam-solid interactions and transient thermal processing

Materials Research Society Symposium Proceedings, vol. 23

1984

Electronic defects in CW transient thermal processed silicon

Semiconductors and Semimetals, Vol. 17

1984

Electronic deep levels in laser-crystallized silicon thin-film MOS capacitors on fused silica

Materials Research Society Symposia Proceedings vol. 33

1984

Charge transient and optical absorption measurements of characteristic gap states in phosphorus doped a-Si:H

Journal of Non-Crystalline Solids

1984

Defect reduction by tilted zone crystallization of patterned silicon films on fused silica

Energy Beam-Solid Interactions and Transient Thermal Processing, Materials Research Society Symposium Proceedings, vol. 23

1984

Analysis of implanted boron profiles across the Si-SiO2 interface by secondary ion mass spectrometry

Thin Films and Interfaces II, Materials Research Society Symposium Proceedings, vol. 25

1984

NMOS logic circuits in laser-crystallized silicon on quartz

Energy Beam-Solid Interactions and Transient Thermal Processing, MRS Symposium Proceedings vol. 23

1984

NMOS dynamic shift registers in CO2 laser-crystallized silicon thin-films on fused quartz

Materials Research Society Symposium Proceedings vol. 33

1984

High-gain photodetectors in thin-film transistors fabricated from laser-crystallized silicon on fused silica

Technical Digest - International Electron Devices Meeting

1984

Devices and circuits in laser-crystallized silicon thin films on fused silica

Proceedings - The Electrochemical Society

1984

Capture and tunnel emission of electrons by deep levels in ultrathin nitrided oxides on silicon

Applied Physics Letters

1984

Human limits and the VDT computer interface

Visual Display Terminals; Usability Issues and Health Concerns.

1 January 1984

Mockingbird: a composer's amanuensis

BYTE Magazine

1 January 1984

Smalltalk-80: the language and its implementation

Addison-Wesley

1983

Smalltalk-80: the interactive programming environment

Addison-Wesley

1983

The psychology of human-computer interaction

Erlbaum Associates

1983

Curve-fitting with piecewise parametric cubics

SIGGRAPH '83

25 July 1983

The evaluation of pointing devices

Digest of Papers Spring COMPCON 83

28 February 1983

Mockingbird: a composer's amanuensis

PARC tech report

January 1983

Correlated paramagnetic defects and electronic deep levels at the oxidized silicon surface

Proceedings of the International Conference on Insulating Films on Semiconductors

1983

Electron-beam-induced-current measurements in silicon-on-insulator films prepared by zone-melting recrystallization

Applied Physics Letters

1983

Thin film transistors in CO2-laser crystallized silicon films on fused silica

Proceedings of the Materials Research Society Symposium on Laser-Solid Interactions and Transient Thermal Processing of Materials

1983

Measurement of deep levels in hydrogenated amorphous silicon by transient voltage spectroscopy

Applied Physics Letters

1983

Detection of electronic defects in strip-heater crystallized silicon thin films

Proceedings of the Materials Research Society Symposium on Laser-Solid Interactions and Transient Thermal Processing of Materials

1983

Deep-level distributions in hydrogenated amorphous silicon

Journal of Non-Crystalline Solids

1983

Characteristic electronic defects at the Si-SiO2 interface

Applied Physics Letters

1983

Density of gap states of silicon grain boundaries determined by optical absorption

Applied Physics Letters

1983

High-performance thin-film transistors in CO2 laser crystallized silicon on quartz

Proceedings of SPIE

1983

Laser-induced crystallization of silicon on bulk amorphous substrates: an overview

Proceedings of the MRS Symposium on Laser-Solid Interactions and Transient Thermal Processing of Materials

1983

Quantum theory of magnetism

Springer Verlag

1983

The organization of expert systems: a tutorial

Artificial Intelligence

31 December 1982

Applying cognitive psychology to computer systems: a graduate seminar in psychology

SIGCSE Bulletin

1 September 1982

User perceptual mechanisms in the search of computer command menus

Proceedings of the 1982 Conference on Human Factors in Computing Systems

15 March 1982

Dual-gate a-Si:H thin film transistors

IEEE Electron Device Letters

1982

Thin-film transistors on a-Si:H

IEEE Transactions on Electron Devices

1982

Microstrain in laser-crystallized silicon islands on fused silica

Applied Physics Letters

1982

Single-crystal silicon transistors in laser-crystallized thin films on bulk glass

IEEE Electron Device Letters

1982

Measurement of semiconductor-insulator interface states by constant-capacitance deep-level transient spectroscopy (summary)

Journal of Vacuum Science and Technology

1982

Measurement of semiconductor-insulator interface states by constant-capacitance, deep-level transient spectroscopy

Journal of Vacuum Science and Technology

1982

Grain boundaries in crystallized silicon thin films

Grain Boundaries in Semiconductors

1982