The electrical characterization of surfaces, interfaces, and contacts to a-Si:H

Philosophical Magazine B

1985

Visual search of computer command menus

Attention and Performance X, Control of Language Processes; International Symposium on Attention and Performance; 1982; Venlo, N

31 December 1984

Window-based computer dialogues

INTERACT '84; First IFIP Conference on Human-Computer Interaction

4 September 1984

On-line composition of text

INTERACT '84; First IFIP Conference on Human-Computer Interaction

4 September 1984

Photodepopulation-induced ESR measurement of deep gap states in a-Si:H

Proceedings of AIP Conference on Optical Effects in Amorphous Semiconductors

August 1984

Mockingbird: a composer's amanuensis

BYTE Magazine

1 January 1984

Human limits and the VDT computer interface

Visual Display Terminals; Usability Issues and Health Concerns.

1 January 1984

Capture and tunnel emission of electrons by deep levels in ultrathin nitrided oxides on silicon

Applied Physics Letters

1984

Devices and circuits in laser-crystallized silicon thin films on fused silica

Proceedings - The Electrochemical Society

1984

High-gain photodetectors in thin-film transistors fabricated from laser-crystallized silicon on fused silica

Technical Digest - International Electron Devices Meeting

1984

NMOS dynamic shift registers in CO2 laser-crystallized silicon thin-films on fused quartz

Materials Research Society Symposium Proceedings vol. 33

1984

NMOS logic circuits in laser-crystallized silicon on quartz

Energy Beam-Solid Interactions and Transient Thermal Processing, MRS Symposium Proceedings vol. 23

1984

Analysis of implanted boron profiles across the Si-SiO2 interface by secondary ion mass spectrometry

Thin Films and Interfaces II, Materials Research Society Symposium Proceedings, vol. 25

1984

Defect reduction by tilted zone crystallization of patterned silicon films on fused silica

Energy Beam-Solid Interactions and Transient Thermal Processing, Materials Research Society Symposium Proceedings, vol. 23

1984

Charge transient and optical absorption measurements of characteristic gap states in phosphorus doped a-Si:H

Journal of Non-Crystalline Solids

1984

Electronic deep levels in laser-crystallized silicon thin-film MOS capacitors on fused silica

Materials Research Society Symposia Proceedings vol. 33

1984

Electronic defects in CW transient thermal processed silicon

Semiconductors and Semimetals, Vol. 17

1984

Highly photosensitive transistors in single-crystal silicon thin films on fused silica

Applied Physics Letters

1984

Electronic defects in silicon after transient isothermal annealing

Energy Beam-Solid Interactions and Transient Thermal Processing, MRS Symposium Proceedings, vol. 23

1984

Electronic traps and Pb centers at the Si/SiO2 interface: band-gap energy distribution

Journal of Applied Physics

1984

Curve-fitting with piecewise parametric cubics

SIGGRAPH '83

25 July 1983

The evaluation of pointing devices

Digest of Papers Spring COMPCON 83

28 February 1983

Mockingbird: a composer's amanuensis

PARC tech report

January 1983

Laser-induced crystallization of silicon on bulk amorphous substrates: an overview

Proceedings of the MRS Symposium on Laser-Solid Interactions and Transient Thermal Processing of Materials

1983

High-performance thin-film transistors in CO2 laser crystallized silicon on quartz

Proceedings of SPIE

1983

Density of gap states of silicon grain boundaries determined by optical absorption

Applied Physics Letters

1983

Characteristic electronic defects at the Si-SiO2 interface

Applied Physics Letters

1983

Deep-level distributions in hydrogenated amorphous silicon

Journal of Non-Crystalline Solids

1983

Detection of electronic defects in strip-heater crystallized silicon thin films

Proceedings of the Materials Research Society Symposium on Laser-Solid Interactions and Transient Thermal Processing of Materials

1983

Measurement of deep levels in hydrogenated amorphous silicon by transient voltage spectroscopy

Applied Physics Letters

1983

Thin film transistors in CO2-laser crystallized silicon films on fused silica

Proceedings of the Materials Research Society Symposium on Laser-Solid Interactions and Transient Thermal Processing of Materials

1983

Electron-beam-induced-current measurements in silicon-on-insulator films prepared by zone-melting recrystallization

Applied Physics Letters

1983

Correlated paramagnetic defects and electronic deep levels at the oxidized silicon surface

Proceedings of the International Conference on Insulating Films on Semiconductors

1983

The organization of expert systems: a tutorial

Artificial Intelligence

31 December 1982

Applying cognitive psychology to computer systems: a graduate seminar in psychology

SIGCSE Bulletin

1 September 1982

User perceptual mechanisms in the search of computer command menus

Proceedings of the 1982 Conference on Human Factors in Computing Systems

15 March 1982

Correlated electrical and microstructural studies of recrystallized silicon thin films on bulk glass substrates

Laser and Electron-Beam Interactions with Solids

1982

Deep levels in cw laser-crystallized silicon thin films

Applied Physics Letters

1982

Deuterium passivation of grain-boundary dangling bonds in silicon thin films

Applied Physics Letters

1982

Electronic defects in beam-crystallized silicon

Laser and Electron-Beam Interactions with Solids

1982

Grain boundaries in crystallized silicon thin films

Grain Boundaries in Semiconductors

1982

Measurement of semiconductor-insulator interface states by constant-capacitance, deep-level transient spectroscopy

Journal of Vacuum Science and Technology

1982

Measurement of semiconductor-insulator interface states by constant-capacitance deep-level transient spectroscopy (summary)

Journal of Vacuum Science and Technology

1982

Single-crystal silicon transistors in laser-crystallized thin films on bulk glass

IEEE Electron Device Letters

1982

Microstrain in laser-crystallized silicon islands on fused silica

Applied Physics Letters

1982

Thin-film transistors on a-Si:H

IEEE Transactions on Electron Devices

1982

Dual-gate a-Si:H thin film transistors

IEEE Electron Device Letters

1982

Planning with constraints (MOLGEN Part 1 and Part 2)

Artificial Intelligence

1 May 1981

Laser induced crystal growth of silicon islands on amorphous substrates

Laser and Electron-Beam Solid Interactions and Materials Processing

1981

Laser-induced crystallization of silicon islands on amorphous substrates: multilayer structures

Applied Physics Letters

1981

Deuterium at the Si-SiO2 interface detected by secondary ion mass spectrometry

Applied Physics Letters

1981

Electronic defects in metalorganic GaAlAs

Defects in Semiconductors

1981

Electronic defect levels in plasma-deposited amorphous silicon

Tetrahedrally Bonded Amorphous Semiconductors, AIP Conference Proceedings, vol. 73

1981

Grain boundaries in p-n junction diodes fabricated in laser-recrystallized silicon thin films

Applied Physics Letters

1981

Hydrogenation of defects at the Si-SiO2 interface

Insulating Films on Semiconductors

1981

Low-temperature annealing and hydrogenation of defects at the Si-SiO2 interface

Journal of Vacuum Science and Technology

1981

Processing and properties of CW laser-recrystallized silicon films on amorphous substrates

Laser and Electron-Beam Solid Interactions and Materials Processing

1981

Properties of patterned and CW laser-crystallized silicon films on amorphous substrates

Insulating Films on Semiconductors

1981

Raman spectroscopic evaluation of silicides formed with a scanned electron beam

Laser and Electron-Beam Solid Interactions and Materials Processing

1981

Field-effect transistors in a-Si:H

IEEE Transactions on Electron Devices

1981

Measurement and analysis of current transients in well-characterized a-Si:H

Journal de Physique

1981

Silicide formation in Pd-a-Si:H Schottky barriers

Applied Physics Letters

1981

The keystroke-level model for user performance time with interactive systems

Communications of the ACM

1 July 1980

Computer text-editing: an information-processing analysis of a routine cognitive skill

Cognitive Psychology

1 January 1980

Scanning CW-laser-induced crystallization of silicon on amorphous substrates

Laser and Electron Beam Processing of Materials

1980

Characteristic defects at the Si-SiO2 interface

The Physics of MOS Insulators

1980

A comparison of ion-implantation-induced deep levels in scanned electron-beam-annealed and CW laser-annealed silicon

Laser and Electron Beam Processing of Materials

1980

Deep levels in scanned electron-beam annealed silicon

Applied Physics Letters

1980

Properties of silicon p-n junction diodes processed with a scanned electron beam

IEEE Transactions on Electron Devices

1980

Surface-potential dependence of EPR centers at the Si/SiO2 interface

The Physics of MOS Insulators

1980

Physical properties of ion-implanted SEM-annealed silicon

Laser and Electron Beam Processing of Materials

1980

Defect luminescence in CW laser-annealed silicon

Laser and Electron Beam Processing of Materials

1980

A method for calculating performance times for users of interactive computing systems

Proceedings of the International Conference on Cybernetics and Society

8 October 1979

Studies of the effect of oxidation time and temperature on the Si-SiO2 interface using Auger sputter profiling

Journal of Applied Physics

1979

Constant-capacitance DLTS measurement of defect-density profiles in semiconductors

Journal of Applied Physics

1979

Deep levels in ion-implanted, CW laser-annealed silicon

Laser-Solid Interactions and Laser Processing-1978, AIP Conference Proceedings 50

1979

Electronic defect levels in self-implanted CW laser-annealed silicon

Applied Physics Letters

1979

Energy-resolved DLTS measurement of interface states in MIS structures

Applied Physics Letters

1979

Energy-resolved DLTS measurement of interface states in MOS devices

IEEE Transactions on Electron Devices

1979

Measurement of interface defect states at oxidized silicon surfaces by constant-capacitance DLTS

Journal of Vacuum Science and Technology

1979

High-resolution scanning electron-beam annealing of ion-implanted silicon

Applied Physics Letters

1979

Scanning electron beam annealing with a modified SEM

Journal of Vacuum Science and Technology

1979

Defect luminescence in CW laser-annealed silicon

Journal of Applied Physics

1979

Studies in the psychology of computer text editing systems

PARC technical report SSL-78-1

31 December 1978

Evaluation of mouse, rate-controlled isometric joystick, step keys, and text keys for the text selection on a CRT

Ergonomics

1 January 1978

Raman studies of structural defects in vitreous SiO2 and GeO2

The Physics of SiO2 and Its Interfaces

1978

Auger sputter profiling studies of the Si-SiO2 interface

Semiconductor Characterization Techniques

1978

Auger sputter profiling studies of the Si-SiO2 interface

The Physics of SiO2 and Its Interfaces

1978

New studies of the Si-SiO2 interface using Auger sputter profiling

Solid State Communications

1978

Electronic properties of a characteristic discrete level at the Si-SiO2 interface

IEEE Transactions on Electron Devices

1978

Transient capacitance measurements of electronic states at the SiO2-Si interface

The Physics of SiO2 and Its Interfaces

1978

Evidence for multiphonon emission from interface states in MOS structures

Solid State Communications

1978

Transient capacitance measurements of hole emission from interface states in MOS structures

Applied Physics Letters

1977

Meta-programming: a software production model

PARC Technical Report CSL-76-7

December 1976