Defect identification in large area electronic backplanes

Details

Event IEEE Journal of Display Technology

Authors

Sambandan, Sanjiv

Raj Apte.

Wong, William S.

Lujan, Rene A.

Michael Young

Beverly Russo

Ready, Steven E.

Street, Robert A.

Technical Publications

January 1st 2009

We describe a rapid testing system for active matrix TFT backplanes which enables the identification of many common processing defects. The technique spatially maps the charge feedthrough from TFTs in the pixel and is suited for pixels with switched-capacitor architecture.

Citation

Sambandan, S.; Apte, R. B.; Wong, W. S.; Lujan, R.; Young, M.; Russo, B.; Ready, S. E.; Street, R. A. Defect identification in large area electronic backplanes. IEEE Journal of Display Technology; 2009 January; 5 (1): 27-33.

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