Defect identification in large area electronic backplanes

Details

Event IEEE Journal of Display Technology

Authors

Sambandan, Sanjiv
Raj Apte.
Wong, William S.
Lujan, Rene A.
Michael Young
Beverly Russo
Ready, Steven E.
Street, Robert A.
Technical Publications
January 1st 2009
We describe a rapid testing system for active matrix TFT backplanes which enables the identification of many common processing defects. The technique spatially maps the charge feedthrough from TFTs in the pixel and is suited for pixels with switched-capacitor architecture.

Citation

Sambandan, S.; Apte, R. B.; Wong, W. S.; Lujan, R.; Young, M.; Russo, B.; Ready, S. E.; Street, R. A. Defect identification in large area electronic backplanes. IEEE Journal of Display Technology; 2009 January; 5 (1): 27-33.

Additional information

Focus Areas

Our work is centered around a series of Focus Areas that we believe are the future of science and technology.

FIND OUT MORE
Licensing & Commercialization Opportunities

We’re continually developing new technologies, many of which are available for¬†Commercialization.

FIND OUT MORE
News

PARC scientists and staffers are active members and contributors to the science and technology communities.

FIND OUT MORE