Timing the Occurrence of Randomly Spaced Events using $V_{T}$ Shift in Disordered Semiconductors

This paper discusses the concept of using threshold voltage shift ($V_{T}$ shift) in disordered semiconductors based thin film transistors to measure the time of occurrence of randomly spaced events of interest. We call the experimental circuit an 'analog clock'. The analog clock is shown to be accurate while at the same time being simple in design using just one transistor.

Citation

Sambandan, S.; Arias, A. C.; Street, R. A. Timing randomly spaced events using the threshold-voltage shift in disordered semiconductors. IEEE Transactions on Electron Devices. 2008 December; 55 (12): 3367-3374.